Performance and Applications of the UW Aberration-Corrected STEM
Seminar by Paul Voyles, Materials Science and Engineering
Event Details
Date
Thursday, April 29, 2010
Time
4-5 p.m.
Location
Description
The University of Wisconsin Materials Science Center has installed an aberration-corrected scanning transmission electron microscope (STEM), an instrument capable of 0.08 nm spatial resolution imaging, high current, high sensitivity microanalysis by electron energy loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDXS), and coherent nanodiffraction with probe sizes covering 0.1 to 50 nm in diameter.
Cost
Free
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