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Lessons Learned from the National Fragile X Family Survey

Event Details

Date
Tuesday, January 20, 2009
Time
4:30 p.m.
Location
John D. Wiley Conference Center, T216, Second Floor, North Tower, Waisman Center
Description
Don Bailey, RTI International, and his research team conducted a national survey of more than 1,000 families of children with fragile X syndrome, the leading inherited cause of intellectual disability. This presentation describes how the survey was conducted, summarizes some of the major findings, and discusses potential implications for families, clinicians and researchers.
Cost
Free

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