Materials Science & MRSEC seminar by Oussama Moutanabbir, Engr. Physics, Ecole Polytechnique de Montreal

We employ in situ low energy electron microscopy (LEEM) and photoelectron emission microscopy (PEEM) to probe in real time the dynamics of surface phenomena. In this presentation, I will describe the basics of these two techniques and how we utilize them to investigate the thermal behavior of a variety of materials. I will mainly discuss the thermal stability of exfoliated black phosphorus (bP) and silicon-germanium-tin metastable alloys.