Materials Science Program Seminar
David J. Larson, CAMECA Instruments, Inc.
Event Details
Date
Thursday, May 15, 2014
Time
4-5 p.m.
Location
Description
Atom probe tomography has been used for over 45 years, “to determine the composition of small volumes of metals, semiconductors, and some ceramics”. Although this statement is still true ~15 years after it was written, it does not adequately capture the recent expansion and maturation of atom probe tomography into non-metallurgical applications. Over approximately the last decade, the performance and applicability of atom probe tomography has undergone a revolution due to three factors:
Cost
Free
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