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Materials Science Program Seminar

David J. Larson, CAMECA Instruments, Inc.

Event Details

Date
Thursday, May 15, 2014
Time
4-5 p.m.
Description
Atom probe tomography has been used for over 45 years, “to determine the composition of small volumes of metals, semiconductors, and some ceramics”. Although this statement is still true ~15 years after it was written, it does not adequately capture the recent expansion and maturation of atom probe tomography into non-metallurgical applications. Over approximately the last decade, the performance and applicability of atom probe tomography has undergone a revolution due to three factors:
Cost
Free

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