Materials Science Program Seminar
Organic depth profiling with Static SIMS and evidence for temperature dependent cesium relocation during SIMS analysis
Event Details
Date
Thursday, March 12, 2015
Time
4-5 p.m.
Location
Description
Lecture by Jerry Hunter, Ph.D. Part 1: Organic Depth Profiling with Static SIMS. Part 2: Evidence for temperature dependent Cesium relocation during SIMS analysis.
Cost
Free
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